北京欧兰科技发展有限公司

MCL-NSOM近场扫描光学显微镜

Nano-MET10 & Nano-MET20

特点

低噪声原子步进性能

经过校准的弯曲导向闭环纳米定位器

在扫描范围内平面外运动小于1纳米

专有的PicoQ®低噪声传感器

长行程、高稳定性的微定位

自动校准和初始化

自动软件和硬件设置

对经验丰富的用户可调参数

用户友好的探针更换

简单安装，桌上型设计

包括AFMView®软件 - 硬件控制和数据采集

图像分析软件选项

应用

原子力显微镜
相位显微镜
磁力显微镜
电力显微镜
横向力显微镜
扫描隧道显微镜
开尔文探针显微镜
电导原子力显微镜
电力显微镜
压电力显微镜
纳米光刻术
生物原子力显微镜

产品描述

MadAFM™是一款新型的样品扫描原子力显微镜（AFM），设计用于简便使用和简单安装。MadAFM™包括我们行业领先的闭环纳米定位器，用于样品和探针的精密位移平台。Mad City Labs已经设计和制造了超过25年的压电闭环纳米定位器。由于我们的专有PicoQ®传感器，我们的纳米定位器提供了可用的最低噪声和最高分辨率。这些传感器以其超低噪声性能而闻名。我们的纳米定位器通过我们的高性能共振探针AFM展现出了卓越的运动解耦，几乎不可测量的平面外运动。除了XYZ纳米定位器外，MadAFM™还集成了我们的智能控制、高稳定性的电动微定位器。这些微定位器允许样品（XY）的长程运动、焦点控制和AFM头部（Z）的位移定位。焦点、AFM头部和探针定位器垂直对齐且同轴，可以直接通过1.6MP CMOS相机在样品表面和悬臂之间获得轴线视图。样品照明通过同轴白色LED进行，而635nm激光对准则通过相机辅助，手动操作。MadAFM™可容纳长宽高为50mm x 50mm x 40mm的样品。MadAFM™支持多种显微镜模式（请参阅规格表），并包括AFMView®-OD软件，用于处理所有硬件控制和数据采集。用户友好的软件具有自动校准和初始化功能，使即使是新手用户也能快速上手。该软件允许高级用户访问指定参数。MadAFM™与第三方分析软件MountainsSPIP®和Gwyddion兼容。MadAFM™尺寸适合桌面，并且安装简单，用户设置最小。MadAFM™需要额外配置振动和声学隔离平台。所有安装均可由用户自行完成。

Technical Specifications
MadAFM™ Motion Control
Closed Loop Nanopositioners	(X. Y) 30 um, 65 um or 100 um, (Z) 15 um or 30 um
Mechanism, (X,Y,Z)	Piezo, flexure guided,
Position Sensors (X,Y,,Z)	PicoQ
Nanopositioner step size (30 um travel)	0.03 nm
Position noise floor (30 um travel)	2.7 picometers peak to peak
Micropositioners travel	25 mm (X, Y, Focus), 50 mm (Z)
Sample size (X,Y,Z)	50 mm X 50mm X 40mm
Sample weight	Up to 500 grams
MadAFM™ Optics
Laser	635 nm (Class II)
Laser Alignment	Manual
Camera	1.6 MP CMOS
Objective lens focal length	85mm
Sample illumination	Coaxial white LED
MadAFM™ Controller
ADC	15 channels - (3) 24 bit for PicoQ sensors
DAC	11 channels, - (3) 20 bit for X,Y,Z nanopositioning
External signal signal access (I/O)	14 channels,, 12 BNC ports (including 4 TTL), 2 on Microscope
Lock-in Amplifier	single channel, dual phase hybrid
Nanopositioner connector	DB-50
Micropositioner connector	DB-37
LED Indicators	Micropositioner / (XYZ) Focus / Laser on
Software	AFMView®-OD
PC connection	USB 2.0
Modes*
Imaging Modes	Contact AFM, Intermittent AFM, Non-Contact AFM, Constant Height AFM, Lateral Force Microscopy, Phase Microscopy
Electrical Modes	Scanning Tunneling Microscopy, Conductive AFM, I-V Spectroscopy, Electrical Force Microscopy, Kelvin Probe Microscopy, Piezoelectric Force Microscopy
Mechanical Modes	Force Modulation Microscopy, Nanolithography
Force Measurement	Force Distance Spectroscopy, Force Volume Imaging
Magnetic	Magnetic Force MIcroscopy
* Some modes reqluire additional purchased options
Accesories
Liquid Samples	Open Cell Kit / Closed Cell Kit
General
MadAFM™ weight	37 lbs / (16.8 kg)
Microscope dimensions	10" x 11.25" x 19" / (254 mm x 286 mm /483 mm)
Controller weight	9 lbs / (4.1 kg)
Controller dimensions	16.75" x 14" x 19: / (426 mm x 356 mm x 89 mm)
Power	12 VDC / (PN: MCLPS1001)
Computer Requirements (not supplied)
CPU requirements	3.1 GHz or equivalent
RAM requirements	4 Gbytes or more
PC Connection	1 x USB 2.0 and 1 x USB 3.0
Operating System	Windows 8.1/10/11 - 32 bit and 64 bit

Image Gallery

Image of 312 pm atomic steps on Si(111) substrate measured using MadAFM™ 6515, in contact mode. Image size 2 um x 2 um

Image of 1.5 nm atomic steps on SiC substrate measured using MadAFM™ 6515, in contact mode. Image size 2 um x 2 um

Calibration grid with 110nm feature height. Contact mode using MadAFM™ 6515. Image size: 30 um x 30um

Topographic image of alternating Au and Al lines (35 nm height) using MadAFM™ 6515. Image size: 10 um x 10um.

Kelvin mode, image of alternating Au and Al lines, 25 nm lift height using MadAFM™ 6515. Image size 10 um x 10um.

Topographic image of alternating Au and Al lines (35 nm height) using MadAFM™6515. Image size 10 um x 10um.

Electric Force Microscopy image of alternating Au and Al lines (35 nm height) using MadAFM™6515 Gold lines are grounded while Al lines are 1.0V. Image size 10 um x 10um.

产品描述

Technical Specifications

MadAFM™ Motion Control

MadAFM™ Optics

MadAFM™ Controller

Modes*

Accesories

General

Computer Requirements (not supplied)

Image Gallery

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