 |
 AFM/NSOM
| Product |
Description |
Applications |
SPM-M Kit
|
High resolution, closed loop, scanning resonant probe microscope |
nanoscale characterization, nanoscale fabrication, optical antennas, nano-optics, semiconductors, data storage, and more |
MadPLL®
|
Fully integrated instrument package that allows the user to create a low cost, closed loop, "instant" AFM or NSOM |
AFM and NSOM |
| Tuning Forks |
Quartz crystal tuning forks, fully compatible with the MadPLL® instrument package |
scanning probe microscopy, atomic force microscopy (AFM), near-field scanning optical microscopy (NSOM) |
Nano-MET10 & Nano-MET20
|
High speed, ultra-low noise system with ranges of motion 10 µm or 20 µm |
high speed, high resolution positioning, Metrology, AFM, SPM |
Nano-METZ
|
High speed, ultra-low noise system with range of motion 5 µm |
high speed, high resolution positioning, Metrology, AFM, SPM |
Nano-MET Series
|
High speed, ultra-low noise system with ranges of motion 75 µm (XY) and 5 µm (Z) |
high speed, high resolution positioning, Metrology, AFM, SPM |
| Nano-SPM200 |
Compact nanopositioning system with 200µm travel |
AFM, NSOM, SPM, nanofabrication |
Nano-LPQ
|
Ultra-low profile, high speed nanopositioning system with 75 microns of travel in XY and 50 microns of travel in Z |
optical trapping, optical tweezers, high speed particle tracking, NSOM, SPM |
Nano-HS3M
|
High speed, ultra-low noise system with range of motion 10 µm (XY) and 5 µm (Z) |
high speed, high resolution positioning, Metrology, AFM, SPM | | |
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