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Instrument Solutions
High precision motion is often the cornerstone of research grade instruments. Mad City Labs has developed instrument components for metrology that ease integration and assist users with developing and adapting instrumentation for their own application requirements. Our experienced sales and engineering team can assist you further with the right solution for your application.

Nanopositioning Systems

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combined manual micropositioner and nanopositioner

  Single Molecule Imaging

Product Description Applications
MicroMirror TIRF System unique TIRF system using through-the-objective excitation with two broadband micro-mirrors positioned at the back aperture of the objective lens TIRF, super-resolution (sr) microscopy, single molecule microscopy
Nano-Cyte® 3D stability for imaging microscope focus drift correction for super-resolution (sr) microscopy, live cell imaging, single molecule microscopy
RM21™ Microscope Platform Precision aligned microscope platform optical microscopy, super-resolution (SR) microscopy, live cell imaging, single molecule microscopy and spectroscopy
Cyto-Lite™ Multi-wavelength laser engine optical microscopy, super-resolution (SR) microscopy, live cell imaging, single molecule microscopy and spectroscopy
C-Focus™ Automatic microscope focus drift correction microscope focus correction, high speed confocal imaging
Nano-View® Series Fully integrated nanopositioning and micropositioning systems for use with inverted optical microscopes, combined with a high resolution, 2-axis or 3-axis nanopositioner confocal and fluorescence imaging, single molecule microscopy and spectroscopy, particle tracking, optical trapping, optical tweezers, super resolution (SR) microscopy
Nano-View®/M Fully integrated nanopositioning and micropositioning systems for use with inverted optical microscopes, combined with a high resolution, 2-axis or 3-axis nanopositioner confocal and fluorescence imaging, single molecule microscopy and spectroscopy, particle tracking, optical trapping, optical tweezers, super resolution (SR) microscopy
MCL-MANNZ Integrated micro-nanopositioning system for use with inverted optical microscopes, combining a manual micrometer driven, two axis, linear motion stage with a high resolution z-axis nanopositioner. optical microscopy, confocal imaging, fluorescence imaging, single molecule spectroscopy, nanomanipulation, STORM and PALM imaging
MCL-MOTNZ Value priced positioning system for use with inverted optical microscopes, combining a stepper motor XY linear motion stage with a closed loop high resolution Z-axis nanopositioning system. optical microscopy, confocal imaging, fluorescence imaging, single molecule spectroscopy, nanomanipulation, STORM and PALM imaging

MadPLL phase lock loop instrument package

  AFM/NSOM

Product Description Applications
SPM-M Kit
High resolution, closed loop, scanning resonant probe microscope nanoscale characterization, nanoscale fabrication, optical antennas, nano-optics, semiconductors, data storage, and more
MadPLL®
Fully integrated instrument package that allows the user to create a low cost, closed loop, "instant" AFM or NSOM AFM and NSOM
Tuning Forks Quartz crystal tuning forks, fully compatible with the MadPLL® instrument package scanning probe microscopy, atomic force microscopy (AFM), near-field scanning optical microscopy (NSOM)
Nano-MET10 & Nano-MET20
High speed, ultra-low noise system with ranges of motion 10 µm or 20 µm high speed, high resolution positioning, Metrology, AFM, SPM
Nano-METZ
High speed, ultra-low noise system with range of motion 5 µm high speed, high resolution positioning, Metrology, AFM, SPM
Nano-MET Series
High speed, ultra-low noise system with ranges of motion 75 µm (XY) and 5 µm (Z) high speed, high resolution positioning, Metrology, AFM, SPM
Nano-SPM200 Compact nanopositioning system with 200µm travel AFM, NSOM, SPM, nanofabrication
Nano-LPQ
Ultra-low profile, high speed nanopositioning system with 75 microns of travel in XY and 50 microns of travel in Z optical trapping, optical tweezers, high speed particle tracking, NSOM, SPM
Nano-HS3M
High speed, ultra-low noise system with range of motion 10 µm (XY) and 5 µm (Z) high speed, high resolution positioning, Metrology, AFM, SPM

nanometer measurement gauge

  Nanometer Measurement

Product Description Applications
Nano-Gauge™ Series Ultra-high precision, single axis, displacement measuring devices metrology, alignment, nanopositioner calibration, transducer calibration, position creep measurements

UHV nanopositioner

  Vacuum Compatible Instruments

Nearly all standard systems can be modified for vacuum applications to 10-8 Torr if baking is not necessary. Many UHV applications require custom designed solutions. With experienced UHV instrumentation specialists on staff, we can provide custom nanopositioning solutions. For design guidance see our custom page or contact our vacuum specialists.

Product Description Axes Applications
Nano-UHV50
Ultra High Vacuum (UHV) compatible nanopositioner with 50 µm range of motion in X and Y, can be baked at temperatures up to 100° C 2 X-ray, VUV, and optical microscopy, UHV AFM, wafer testing
Nano-UHV100 Ultra High Vacuum (UHV) compatible nanopositioner with 100 µm range of motion in X and Y, can be baked at temperatures up to 100° C 2 X-ray, VUV, and optical microscopy, UHV AFM, wafer testing
Nano-UHV200 Ultra High Vacuum (UHV) compatible sub-nanometer precision scanner with 200 µm range of motion in X, Y and Z, can be baked at temperatures up to 100° C. 3 X-ray, VUV, and optical microscopy, UHV AFM, wafer testing
MadMotor™-UHV piezo motor stage
Precision, piezo motor driven, micropositioning system for high precision alignment over long travel ranges, using proprietary MadMotor™ piezo motor technology with travel up to 10mm per axis, high resolution, and excellent repeatability. up to 3 precision alignment in UHV, sample and probe positioning, UHV sample transfer

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